Bridge structure appearance defect recording method based on 2D layout drawing

• Main Authors: LI RENFU, ZHANG PENG, WANG JINSONG, SUN ZHONGYANG, LIU DAYANG, LI GONGWEN, TANG DINGMEI, SI XINHUA, HUANG GUANGQING, MIAO QINGXU
• Format: Patent
• Language: Chinese; English
• Published: 30.10.2020
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; PHYSICS

The invention relates to a bridge structure appearance defect recording method based on a 2D layout drawing, and belongs to the technical field of structure safety detection. The method comprises thefollowing steps: S1, customizing a defect icon; s2, collecting defect component information, and presenting a bridge detection system on a 2D distribution diagram in a proper proportion according to the actual length and width values of the components; and S3, collecting defect information of the component, and selecting a proper icon on the 2D display layout to be accurately drawn according to the observed defect information. Through a graph drawing method, the workload of on-site bridge appearance detection can be greatly reduced, the input mode is rapid, simple and convenient, and comparedwith conventional detection, the method has more advantages. 本发明涉及一种基于2D展布图的桥梁结构外观缺陷记录方法，属于结构安全检测技术领域。该方法包括：S1：自定义缺陷图标；S2：采集缺陷构件信息，桥梁检测系统根据构件的实际长宽值按合适比例呈现在2D展布图上；S3：采集构件缺陷信息，根据观测到的缺陷信息在2D展布图上选择合适的图标准确绘制出来。本发明通过图形绘制的方法，可以大幅减轻现场