COF soft board defect detection method

• Main Authors: LIAO XUAN, YANG HAIDONG, ZHANG PENGZHONG
• Format: Patent
• Language: Chinese; English
• Published: 30.10.2020
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a COF soft board defect detection method. The method comprises the following steps of S01, obtaining a COF soft board image, and performing Fourier transform on the COF soft board image to obtain a frequency domain graph and a power spectrum after the transform; S02, setting a low-energy threshold value and a high-energy threshold value for the power spectrum, and mapping an area, between the low-energy threshold value and the high-energy threshold value, in the power spectrum into a frequency domain graph to generate a band elimination notch filter; S03, filtering thefrequency domain graph by adopting the band elimination notch filter to obtain a filtered frequency domain graph; S04, converting the filtered frequency domain graph back to a spatial domain, and finding out a potential defect area through a local dynamic threshold method; and S05, carrying out area screening on the potential defect area to obtain an accurate defect area, and outputting the accurate defect area. According