Training machine learning model with synthetic images

• Main Authors: KOWALSKI MICHAEL, HEGDE ARJUN, RILEY IAN, HE LI, VENKATARAMAN SANKAR
• Format: Patent
• Language: Chinese; English
• Published: 23.10.2020
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; PHYSICS

Methods and systems for training a machine learning model using synthetic defect images are provided. One system includes one or more components executed by one or more computer subsystems. The one ormore components include a graphical user interface (GUI) configured for displaying one or more images for a specimen and image editing tools to a user and for receiving input from the user that includes one or more alterations to at least one of the images using one or more of the image editing tools. The component(s) also include an image processing module configured for applying the alteration(s) to the at least one image thereby generating at least one modified image and storing the at least one modified image in a training set. The computer subsystem(s) are configured for training a machine learning model with the training set in which the at least one modified image is stored. 本发明提供用于使用合成缺陷图像训练机器学习模型的方法及系统。一种系统包含由一或多个计算机子系统执行的一或多个组件。所述一或多个组件包含图形用户接口GUI，所述GUI经配置用于将样品的一或多个图像及图像编辑工具显示给用户且用于从所述用户接收输入，所述输入包含使用所述图