Non-invasive MC/DC coverage rate statistical analysis method

The invention relates to a non-invasive MC/DC coverage rate statistical analysis method which comprises the following steps: establishing an embedded software virtualization simulation running environment; circularly reading the source code, removing an annotation part in the source code through ana...

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Bibliographic Details
Main Authors AN HENG, ZHANG YUSHUANG, FU XIUFENG, JIA ZHANGTAO, LI YASI, JIN YUCHUAN
Format Patent
LanguageChinese
English
Published 23.10.2020
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:The invention relates to a non-invasive MC/DC coverage rate statistical analysis method which comprises the following steps: establishing an embedded software virtualization simulation running environment; circularly reading the source code, removing an annotation part in the source code through analysis, and analyzing source file branch information and logic expression information; obtaining target code information of the logic expression; performing simulation operation, reading an instruction, translating the instruction, executing the current instruction, recording MC/DC coverage rate, andwriting coverage rate information into a file of a specified path in a specific format; and performing MC/DC coverage rate execution result interpretation and feedback. According to the invention, the method includes visualizing a simulation operation environment through embedded software; analyzing the type of a target file and the type of a debugging information format under different processorarchitectures, and analyz
Bibliography:Application Number: CN202010635114