Fault identification method using infrared inspection shooting

• Main Authors: REN YANHAO, LI XINJIA, FENG JIANFENG, LU WENLIAN
• Format: Patent
• Language: Chinese; English
• Published: 02.10.2020
• Subjects: CALCULATING; CHAMBERS PROVIDED WITH MANIPULATION DEVICES; COMPUTING; COUNTING; HAND TOOLS; HANDLING RECORD CARRIERS; MANIPULATORS; PERFORMING OPERATIONS; PHYSICS; PORTABLE POWER-DRIVEN TOOLS; PRESENTATION OF DATA; RECOGNITION OF DATA; RECORD CARRIERS; TRANSPORTING

The invention provides a fault identification method using infrared inspection shooting, and belongs to the field of equipment management. The method comprises the following steps: 1, setting a camerato be in a widest angle state, shooting a panorama, and storing the panorama; 2, performing detection and image segmentation on the panorama to obtain a panorama segmentation image, and preliminarilydetermining equipment with faults in the to-be-detected equipment; 3, determining the number of to-be-detected devices in the panoramic segmentation map, and setting a detection sequence of inspection of the to-be-detected devices; 4, shooting the to-be-detected equipment to obtain a single to-be-detected equipment picture; step 5, identifying a single to-be-detected equipment picture; 6, performing image segmentation on the single to-be-detected equipment picture, and determining whether the to-be-detected equipment corresponding to the single to-be-detected equipment picture has a fault ornot; 7, generating a detect