Fault identification method using infrared inspection shooting
The invention provides a fault identification method using infrared inspection shooting, and belongs to the field of equipment management. The method comprises the following steps: 1, setting a camerato be in a widest angle state, shooting a panorama, and storing the panorama; 2, performing detectio...
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Main Authors | , , , |
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Format | Patent |
Language | Chinese English |
Published |
02.10.2020
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Subjects | |
Online Access | Get full text |
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Summary: | The invention provides a fault identification method using infrared inspection shooting, and belongs to the field of equipment management. The method comprises the following steps: 1, setting a camerato be in a widest angle state, shooting a panorama, and storing the panorama; 2, performing detection and image segmentation on the panorama to obtain a panorama segmentation image, and preliminarilydetermining equipment with faults in the to-be-detected equipment; 3, determining the number of to-be-detected devices in the panoramic segmentation map, and setting a detection sequence of inspection of the to-be-detected devices; 4, shooting the to-be-detected equipment to obtain a single to-be-detected equipment picture; step 5, identifying a single to-be-detected equipment picture; 6, performing image segmentation on the single to-be-detected equipment picture, and determining whether the to-be-detected equipment corresponding to the single to-be-detected equipment picture has a fault ornot; 7, generating a detect |
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Bibliography: | Application Number: CN202010573632 |