Test path generation method based on state transition diagram

The invention provides a test path generation method based on a state transition diagram. The method comprises the following steps: judging whether a state transition pair needs to be covered or not;generating a first test path set covering each intermediate state under the condition that the state...

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Bibliographic Details
Main Authors JIA JINYAN, DONG DONGMEI, KANG KAI, FANG YUNYU
Format Patent
LanguageChinese
English
Published 29.09.2020
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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