Test path generation method based on state transition diagram

• Main Authors: JIA JINYAN, DONG DONGMEI, KANG KAI, FANG YUNYU
• Format: Patent
• Language: Chinese; English
• Published: 29.09.2020
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The invention provides a test path generation method based on a state transition diagram. The method comprises the following steps: judging whether a state transition pair needs to be covered or not;generating a first test path set covering each intermediate state under the condition that the state transition pair does not need to be covered; generating a test path covering each transfer and obtaining a union set with the first test path set to obtain a second test path set; determining the number of cycles of the first cycle sub-paths, generating a test path covering each first cycle sub-path, and obtaining a union set of the test paths and the second test path set to obtain a third test path set; under the condition that the state transition pairs need to be covered, generating a fourthtest path set covering each state transition pair; and determining the number of cycles of the second cycle sub-paths, generating a test path covering each second cycle sub-path, and obtaining a union set of the test paths an