Anti-radiation reinforced comparator circuit with low offset characteristic
The invention discloses an anti-radiation reinforced comparator circuit with a low offset characteristic. The anti-radiation reinforced comparator circuit comprises a two-stage comparator, an offset calibration circuit and an anti-radiation layout reinforced circuit, the offset calibration circuit i...
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Main Authors | , , , , , , , |
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Format | Patent |
Language | Chinese English |
Published |
22.09.2020
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Subjects | |
Online Access | Get full text |
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Summary: | The invention discloses an anti-radiation reinforced comparator circuit with a low offset characteristic. The anti-radiation reinforced comparator circuit comprises a two-stage comparator, an offset calibration circuit and an anti-radiation layout reinforced circuit, the offset calibration circuit is used for extracting and converting the offset code output by the Latch latch; negative feedback isformed with the two-stage comparator to continuously perform calibration adjustment; an input geminate transistor threshold voltage matching error caused by a total dose effect and random maladjustment generated in a tape-out process are eliminated; meanwhile, a novel I-shaped gate reinforcement technology is adopted to solve the problems of threshold voltage drift and switch electric leakage ofthe MOS tube caused by a total dose irradiation environment, and the influence capability of the irradiation total dose effect is counteracted while the total dose resistance of the circuit is ensured.
一种具有低失调特点的抗辐照加固比较器电路,包括两 |
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Bibliography: | Application Number: CN202010560479 |