Anti-radiation reinforced comparator circuit with low offset characteristic

The invention discloses an anti-radiation reinforced comparator circuit with a low offset characteristic. The anti-radiation reinforced comparator circuit comprises a two-stage comparator, an offset calibration circuit and an anti-radiation layout reinforced circuit, the offset calibration circuit i...

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Bibliographic Details
Main Authors WANG ZONGMIN, ZHANG TIELIANG, WANG XINGSHU, ZHAO JINCAI, YANG SONG, LI XIZE, XUE PEIFAN, LI ZE
Format Patent
LanguageChinese
English
Published 22.09.2020
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Summary:The invention discloses an anti-radiation reinforced comparator circuit with a low offset characteristic. The anti-radiation reinforced comparator circuit comprises a two-stage comparator, an offset calibration circuit and an anti-radiation layout reinforced circuit, the offset calibration circuit is used for extracting and converting the offset code output by the Latch latch; negative feedback isformed with the two-stage comparator to continuously perform calibration adjustment; an input geminate transistor threshold voltage matching error caused by a total dose effect and random maladjustment generated in a tape-out process are eliminated; meanwhile, a novel I-shaped gate reinforcement technology is adopted to solve the problems of threshold voltage drift and switch electric leakage ofthe MOS tube caused by a total dose irradiation environment, and the influence capability of the irradiation total dose effect is counteracted while the total dose resistance of the circuit is ensured. 一种具有低失调特点的抗辐照加固比较器电路,包括两
Bibliography:Application Number: CN202010560479