Method for analyzing temperature-induced phase change of silicate crystals by using in-situ high-temperature Raman spectroscopy

• Main Authors: WANG MIN, MA JINJIN, YOU JINGLIN
• Format: Patent
• Language: Chinese; English
• Published: 22.09.2020
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a method for analyzing temperature-induced phase change of silicate crystals by using in-situ high-temperature Raman spectroscopy, and belongs to the field of material structure analysis under extreme conditions. The method is characterized by comprising the following steps that (1) a high-temperature Raman spectrometer is improved; (2) a novel high-temperature observationfurnace with the model of DP is utilized, and the heating and cooling speed is high; (3) the Raman spectrometer is calibrated before the test; (4) the sample is put into a high-temperature-resistant platinum crucible to carry out a heating experiment; and (5) a spectrogram obtained by detection is analyzed so as to judge which temperature point phase of the crystal is changed into which substance.The method is advantaged in that a Raman spectrogram with a high signal-to-noise ratio can be obtained, the temperature-induced phase change process of the crystal can be judged, a method is providedfor analyzing a substance