A method and device for simulating integrated circuit device

• Main Authors: LI DONGSHUAI, LUO JIAJUN, BU JIANHUI, ZHAO FAZHAN, LIU HAINAN, HAN ZHENGSHENG, WANG CHENGCHENG
• Format: Patent
• Language: Chinese; English
• Published: 18.09.2020
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The invention provides a method and a device for simulating an integrated circuit device. The method comprises the steps of determining at least one temperature interval according to a historical simulation result of the integrated circuit device; for different temperature intervals, extracting corresponding device model parameters, and building corresponding sub-device models according to the model parameters; combining the sub-device models to obtain a current semiconductor device model; when the integrated circuit device needs to be simulated again, receiving a target temperature required by simulation, and determining a target temperature interval to which the target temperature belongs and a sub-device model corresponding to the target temperature interval in the current semiconductordevice model; simulating the integrated circuit device by using the corresponding sub-device model. Thus, different temperature intervals correspond to different sub-device models, so that when the integrated circuit device