Extended EDAC check circuit and read-write method for extended Flash program storage area

• Main Authors: CHEN YANG, WANG PENG, QUAN YONGTAO, LU HAIQUAN, LIU SHURONG
• Format: Patent
• Language: Chinese; English
• Published: 18.09.2020
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; INFORMATION STORAGE; PHYSICS; STATIC STORES

The invention discloses an extended EDAC check circuit and a read-write method for an extended Flash program storage area. A bus driver, an AND gate, an OR gate and a NOT gate are added between a processor interface and an extended FLASH and used for achieving read-write operation of the extended FLASH2. A data line D [0:7] and a check bit PD [0:7] are connected with a data line of a FLASH throughthe bus driver, and in order to prevent data line conflicts, an OE enabling end of the bus driver is controlled to be gated through GPIO5, GPIO6 and AND gate, OR gate and NOT gate combinational logic; the extended EDAC check circuit and the read-write method can be applied to the FLASH external expansion EDAC function in the space computer miniaturized SIP module; the function can effectively improve the single event upset resistance of the FLASH as a program storage area space; on the premise that the function performance of the whole machine is met, the single event upset resistance of theFLASH serving as a program