SEMICONDUCTOR STRUCTURE, MANUFACTURING METHOD THEREOF AND METHOD FOR DETECTING SHORT THEREOF

• Main Authors: SU HUNG-MING, TAKESAKO KAZUAKI, TSENG CHUNIAO
• Format: Patent
• Language: Chinese; English
• Published: 15.09.2020
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; SEMICONDUCTOR DEVICES

Provided is a semiconductor structure including a substrate, at least two tested structures, an isolation structure, and a short-circuit detection structure. At least two tested structures are disposed on the substrate. At least two tested structures include a conductive material. The isolation stru...