Method for measuring high-reflectivity object through structured light based on color information

• Main Authors: YANG CHAO, ZHANG HAILIANG, ZHANG FUMIN, ZHENG WEIHUA, ZHU ZHENMIN
• Format: Patent
• Language: Chinese; English
• Published: 11.09.2020
• Subjects: CALCULATING; COMPUTING; COUNTING; HANDLING RECORD CARRIERS; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; PHYSICS; PRESENTATION OF DATA; RECOGNITION OF DATA; RECORD CARRIERS

The invention provides a method for measuring a high-reflectivity object by structured light based on color information, which can distinguish a specular reflection area and a diffuse reflection areain an image according to the color information of an the object, mark a highlight area in the image and perform highlight removal processing on the highlight area according to a reflection separationtheory. And repairing tThe highlight-removed image is reparied according to the texture information of the image. According to the invention, the problem of highlight appearing in photographing in actual life can be solved, and the scene of highlight removal can be restored. Compared with a traditional method, the method does not need to shoot a large number of pictures, and the image processing efficiency is greatly improved. Experiments show that the method can also be applied to a structured light three-dimensional measurement method. 本发明提供一种基于颜色信息的结构光测量高反射率物体的方法，其能够根据物体的颜色信息区分图像中镜面反射区域和漫反射区域并标记出图像中的高光区域，根据反射分离理论对高光