Automatic correction method and device for time-of-flight mass spectrometer, and storage medium

• Main Authors: MAI ZEBIN, TAN GUOBIN, NIU HONGZHI, DENG WEI, WU RIWEI
• Format: Patent
• Language: Chinese; English
• Published: 07.08.2020
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS; ELECTRICITY

The invention relates to an automatic correction method and device for a time-of-flight mass spectrometer, and a storage medium. The method comprises the steps: acquiring characteristic parameters ofa time-of-flight mass spectrometer after standard gas with a certain concentration is input; and if the characteristic parameters do not reach corresponding preset values, adjusting the operation parameters of the time-of-flight mass spectrometer according to a preset processing strategy until the characteristic parameters reach the corresponding preset values. According to the invention, characteristic parameters of a time-of-flight mass spectrometer are acquired after standard gas with a certain concentration is input, and when the characteristic parameters do not reach the corresponding preset values, the operation parameters of the time-of-flight mass spectrometer are adjusted according to the preset processing strategy until the characteristic parameters reach the corresponding presetvalues, so that the time-