Defect mapping method

The invention relates to the technical field of defect mapping, in particular to a defect mapping method which comprises the following steps: S1, detecting the version of a mysql database; Ss2, creating a memory table for storing defect data by utilizing the mysql database with the consistent versio...

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Bibliographic Details
Main Authors ZHANG MENG, PANG FENGJIANG, PENG QIDONG, WANG SIPING, ZHOU KAI, WANG SHUANGQIAO
Format Patent
LanguageChinese
English
Published 26.06.2020
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:The invention relates to the technical field of defect mapping, in particular to a defect mapping method which comprises the following steps: S1, detecting the version of a mysql database; Ss2, creating a memory table for storing defect data by utilizing the mysql database with the consistent version, wherein the memory table comprises coordinate information of a position corresponding to the defect data; Ss3, creating an index for a field corresponding to the defect data; Ss4, storing defect data containing bright field defects and dark field defects into a memory table; Ss5, determining thedistance between defects in the bright field defect and the dark field defect; Ss6, judging whether the defects are located at the same position or not according to the distance. Mapping is realized by applying the mysql database, and compared with a traversal comparison mode, the mapping speed is higher in defect mapping, so that the defect detection efficiency is improved, and the product quality detection speed is incr
Bibliography:Application Number: CN202010437360