Monocular laser speckle projection system calibration and depth estimation method applied to high-precision three-dimensional measurement
The invention relates to a monocular laser speckle projection system calibration and depth estimation method applied to high-precision three-dimensional measurement. The problem of extra errors causedby the inaccurate correction of a monocular laser speckle projection system is solved. According to...
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Main Authors | , |
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Format | Patent |
Language | Chinese English |
Published |
05.06.2020
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Subjects | |
Online Access | Get full text |
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Summary: | The invention relates to a monocular laser speckle projection system calibration and depth estimation method applied to high-precision three-dimensional measurement. The problem of extra errors causedby the inaccurate correction of a monocular laser speckle projection system is solved. According to the method, a distortionless virtual left camera is constructed, and a standard reference left viewspeckle image is calculated by using a planar homography matrix to serve as a standard reference image. According to the virtual left camera and the reference left view speckle image, a camera coordinate system and the speckle image shot by the camera are corrected to obtain an image epipolar correction conversion matrix. According to the method, extra errors caused by the fact that a sensor is adopted to determine the depth of the reference image are avoided, the single camera and a laser speckle projector are adopted to construct an equivalent binocular system, the cost is reduced, and themethod is simple and higher |
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Bibliography: | Application Number: CN202010039819 |