Semiconductor element test carrying disc with floating accommodating base and test equipment thereof

• Main Authors: HUANG TENGDA, CHEN FENGJIE
• Format: Patent
• Language: Chinese; English
• Published: 22.05.2020
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention relates to a semiconductor element test carrying disc with a floating accommodating base and test equipment thereof. The semiconductor element test carrying disc comprises a base and theaccommodating base, wherein the accommodating base is provided with a plurality of accommodating grooves for accommodating semiconductor elements and a plurality of spring grooves for accommodating compression springs, the accommodating base is fixedly provided with a plurality of supporting columns, each supporting column is arranged in the base in a penetrating manner, and two buckling pieces are respectively and correspondingly buckled on each supporting column at the bottom of the base and the top of the accommodating base. Therefore, by means of the improved buckling mode, deformation ofthe supporting edge of the base is effectively avoided, disassembly, assembly and replacement in use can be facilitated, and convenience in use of different production lines is improved. 本发明有关于一种具浮动容置座的半导体元件测试载盘及其测试设备，该半导体元件测