Prediction method of adhesive structure failure criterion based on adhesive chemical property analysis

• Main Authors: NA JINGXIN, MENG HUAN, MU WENLONG, WANG GUANGBIN, TAN WEI, SHEN HAO, CHEN HONGLI, LUAN JIANZE, GAO YUAN, FENG YAO
• Format: Patent
• Language: Chinese; English
• Published: 19.05.2020
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTEDFOR SPECIFIC APPLICATION FIELDS; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a prediction method of adhesive structure failure criterion based on adhesive chemical characteristic analysis. The invention develops the prediction method of the adhesive structure failure criterion based on adhesive chemical characteristic analysis. The method comprises the following steps: carrying out artificial accelerated aging treatment on bonding test pieces with different bonding angles; obtaining failure stress related data of the bonding structure in different aging periods through a tensile failure test; establishing a failure criterion through finite element modeling analysis in combination with an equivalent stress relational expression; analyzing the chemical characteristics of the adhesive in different aging periods to obtain a chemical characteristic change rule; calculating and screening out the chemical characteristics in the optimal coincidence state with the bonding structure failure criterion and the combination form of the chemical characteristics, and finally o