High isolation contactor with test pin and housing for integrated circuit testing

A test socket for testing an integrated circuit has the controlled impedance while maintains the structural integrity of the test pins. A pin can have a sidewall with a thick portion and a thinner portion along the length of the pin. The pin can have projections which provide a stand-off from the sl...

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Bibliographic Details
Main Authors SHERRY JEFFREY, ANDRES MICHAEL
Format Patent
LanguageChinese
English
Published 15.05.2020
Subjects
BASIC ELECTRIC ELEMENTS
CURRENT COLLECTORS
ELECTRICITY
LINE CONNECTORS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A test socket for testing an integrated circuit has the controlled impedance while maintains the structural integrity of the test pins. A pin can have a sidewall with a thick portion and a thinner portion along the length of the pin. The pin can have projections which provide a stand-off from the slot. The sidewalls themselves can have projections or lands which extend into the slot and provide stability for the pin. 一种用于测试集成电路的测试插座，具有受控的阻抗，同时保持测试引脚的结构完整性。引脚可以具有侧壁，该侧壁具有沿引脚的长度的厚部和薄部。引脚可以具有突出部，该突出部提供相对于槽的间隔。侧壁本身可以具有延伸到槽中并为引脚提供稳定性的突出部或连接盘。
Bibliography:Application Number: CN201880062342