CONNECTED EPITAXIAL OPTICAL SENSING SYSTEMS

• Main Authors: SIMON DAVID I, BISMUTO ALFREDO, PELC JASON
• Format: Patent
• Language: Chinese; English
• Published: 15.05.2020
• Subjects: BASIC ELECTRIC ELEMENTS; COLORIMETRY; DEVICES USING STIMULATED EMISSION; ELECTRICITY; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; PHYSICS; RADIATION PYROMETRY; TESTING

A device including a plurality of epitaxial chips is disclosed. An epitaxial chip can have one or more of a light source and a detector, where the detector can be configured to measure the optical properties of the light emitted by a light source. In some examples, one or more epitaxial chips can have one or more optical properties that differ from other epitaxial chips. The epitaxial chips can bedependently operable. For example, the detector located on one epitaxial chip can be configured for measuring the optical properties of light emitted by a light source located on another epitaxial chip by way of one or more optical signals. The collection of epitaxial chips can also allow detection of a plurality of laser outputs, where two or more epitaxial chips can have different material and/or optical properties. 本发明公开了一种包括多个外延芯片的设备。外延芯片可具有光源和检测器中的一者或多者，其中该检测器可被配置为测量由光源发射的光的光学属性。在一些示例中，一个或多个外延芯片可具有不同于其他外延芯片的一个或多个光学属性。外延芯片可为能够相依地操作的。例如，位于一个外延芯片上的检测器可被配置用于通过一个或多个光学信号来测量由位于另一个外延芯片上的光源发射的光的光学属性。外延芯片的集合还可允许检测多个激光输出，其