Inductively coupled plasma mass spectrometer with mass correction

Systems and methods for controlling mass filtering of polyatomic ions in an ion beam passing through an inductively coupled plasma mass spectrometer (ICP-MS). Polyatomic ion mass data representative of the exact mass of a polyatomic ion having a target isotope is determined. A control signal is gene...

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Bibliographic Details
Main Authors KELINSKE MARK LEE, SUGIYAMA NAOKI, LIBA AMIR, WOODS GLENN DAVID
Format Patent
LanguageChinese
English
Published 12.05.2020
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Summary:Systems and methods for controlling mass filtering of polyatomic ions in an ion beam passing through an inductively coupled plasma mass spectrometer (ICP-MS). Polyatomic ion mass data representative of the exact mass of a polyatomic ion having a target isotope is determined. A control signal is generated based on the determined polyatomic ion mass data and output to an ICP-MS to filter based on mass the polyatomic ions in the ion beam traveling through the ICP-MS to an ion detector. 用于控制对通过电感耦合等离子体质谱仪(ICP-MS)的离子束中的多原子离子的质量过滤的系统和方法。确定了表示具有靶同位素的多原子离子的精确质量的多原子离子质量数据。基于所确定的多原子离子质量数据生成控制信号,并将所述控制信号输出到ICP-MS,以基于质量对通过所述ICP-MS到达离子检测器的所述离子束中的所述多原子离子进行过滤。
Bibliography:Application Number: CN201911060015