Positive and negative sample data balancing method in factory PCB defect detection

The invention discloses a positive and negative sample data balancing method in factory PCB defect detection, which is a data balancing method in PCB positive and negative sample classification basedon an adversarial generative network, and mainly comprises the following steps: collecting, sorting a...

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Bibliographic Details
Main Authors SHI YANGYI, HUANG KUNSHAN
Format Patent
LanguageChinese
English
Published 08.05.2020
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Summary:The invention discloses a positive and negative sample data balancing method in factory PCB defect detection, which is a data balancing method in PCB positive and negative sample classification basedon an adversarial generative network, and mainly comprises the following steps: collecting, sorting and classifying a data set; designing an encoder which is composed of five convolution layers, and extracting features from the input image by the encoder; designing a converter which is composed of eight residual blocks and converts the feature vector from a source domain to a target domain; designing a decoder, wherein the decoder is composed of five deconvolution layers; designing a discriminator, wherein the discriminator is composed of seven convolution layers; designing a loss function, wherein the loss function comprises four parts; preparing a training set for model training; the obtained weight file is used for a test set, and a negative sample needing to be amplified is synthesized. The method is high in r
Bibliography:Application Number: CN201911134200