Infrared thermal image nondestructive testing method based on electric pulse heating

• Main Authors: LIU KANGLIN, FAN DENGSHUAI, WANG YASHU, ZHANG ZHUWU, GUO JINQUAN
• Format: Patent
• Language: Chinese; English
• Published: 08.05.2020
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention relates to an infrared thermal image nondestructive testing method based on electric pulse heating. The infrared thermal image nondestructive testing method comprises the following steps: S1, determining the thickness, defect depth and applied voltage of a test piece as test factors related to the temperature of the test piece; S2, manufacturing test pieces with different test piecethicknesses and different defect depths; and S3, designing an orthogonal test, taking the temperature of the test piece as a test index, carrying out an infrared thermal image nondestructive testing test based on electric pulse heating on the test pieces with different test piece thicknesses and different defect depths by adopting applied voltages with different magnitudes according to the designed orthogonal test, and determining the influence of the three test factors on the test index. The testing method is beneficial to analysis of influence factors of an electric pulse infrared thermal image nondestructive test r