Switch life evaluation method and system

• Main Author: WANG QUNYONG
• Format: Patent
• Language: Chinese; English
• Published: 05.05.2020
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTEDFOR SPECIFIC APPLICATION FIELDS; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The embodiment of the invention provides a switch service life evaluation method and a system, and the method comprises the steps: firstly obtaining the inherent attribute parameters of a switch and the impact factors of an external environment on the switch, and then evaluating the service life of the switch based on the inherent attribute parameters and the impact factors. According to the switch service life evaluation method provided by the embodiment of the invention, the service life of the switch is evaluated, the influence of heat, electricity, temperature circulation, machinery, humidity and chemical environmental stress on the reliability of the switch is reflected, and the accuracy of switch service life evaluation is effectively improved. 本发明实施例提供了一种开关寿命评估方法及系统，所述方法首先获取开关的固有属性参数以及外界环境对开关的影响因子，然后基于固有属性参数以及影响因子，评估出开关的寿命。通过本发明实施例中提供的开关寿命评估方法评估出开关的寿命，反映了热、电、温度循环、机械、湿度、化学环境应力对开关可靠性的影响，有效提高了开关寿命评估的准确性。