Characteristic measuring device and method thereof, and component mounting device and method thereof

• Main Authors: UCHIDA HIDEKI, KAKISHIMA NOBUYUKI, NOUDO AKIRA, HAMA TOMOO, IZUMIDA KEIZO
• Format: Patent
• Language: Chinese; English
• Published: 21.04.2020
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention provides a characteristic measuring device and a method thereof, and a component mounting device and a method thereof. The characteristic measuring device includes a plurality of electrodes for measuring electrical characteristics of an electronic component, and an anisotropic conductive sheet covering at least a portion of each of the plurality of electrodes. The characteristic measuring device measures the electrical characteristics of an electronic component by applying pressure between the plurality of electrodes and the electronic component placed at any one of a plurality of measurement positions set on a surface of the anisotropic conductive sheet opposite to the plurality of electrodes. 本发明提供一种特性测量装置及其方法、部件安装装置及其方法。特性测量装置具有：用于对电子部件的电特性进行测量的多个电极、覆盖多个电极的各自的至少一部分的各向异性导电片。该特性测量装置对在被设定于各向异性导电片的与多个电极相反的面的多个测量位置的任意位置放置的电子部件与多个电极之间施加压力并测量电子部件的电特性。