Anti-radiation hardening module-level circuit simulation test method

• Main Authors: ZHENG HONGCHAO, WU YONGJUN, WANG LIANG, LI JIANCHENG, XU LEIPEI, ZHAO XU, LI ZHE, YU CHUNQING, CHU FEI, YUE SUGE, MU LILONG, PENG HUIXIN, BI XIAO
• Format: Patent
• Language: Chinese; English
• Published: 14.04.2020
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The invention discloses an anti-radiation hardening module-level circuit simulation test method. An existing commercial software simulation tool is combined with a user-defined development technology;existing radiation test data information is utilized to the greatest extent; single particle results of circuits with the same library unit structure and different functions are counted and distinguished, key factors and influence factors are defined, single particle estimation is conducted through a mathematical statistics method, the single particle estimation results are fed back to the commercial software simulation tool in a model variable mode, and thus the accuracy of the existing simulation tool is improved. According to the method, the links of anti-radiation hardening module-level circuit single particle sensitivity analysis, layout radiation hardening design rule checking and module-level circuit single particle soft error simulation verification are added on the basis of the original design process, a