Detection mark equipment for internal defect of solar crystal column and detection method of detection mark equipment

• Main Authors: LIN HUOWANG, LIU LIQING, LIAO WENMIN
• Format: Patent
• Language: Chinese; English
• Published: 03.01.2020
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention discloses detection mark equipment for internal defect of a solar crystal column and a detection method of the detection mark equipment. The detection mark equipment comprises a rack, wherein a plurality of rollers are arranged on the rack, a crystal column detection station is arranged at one end of each roller, a platform jack-up mechanism is arranged below a crystal column detection station, a near-infrared light source and a near-infrared industrial camera are arranged above the crystal column detection state, a laser distance-measurement device is arranged above the crystalcolumn, and a laser marking head is arranged at one side of the crystal column. The detection mark equipment is used for detection and identification of the solar crystal column, the solar crystal column is placed on a platform, the crystal column is scanned by the near-infrared industrial camera and the near-infrared light source, the defect in the crystal column is detected, an image is sent toa control mechanism, the l