Quantitative calculation method for correlation of two or more test curves

• Main Authors: NA JINGXIN, MU WENLONG, WANG GUANGBIN, TAN WEI, SHEN HAO, LUAN JIANZE, GAO YUAN, FENG YAO
• Format: Patent
• Language: Chinese; English
• Published: 15.11.2019
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The invention discloses a quantitative calculation method for correlation of two test curves. The method comprises the following steps: step 1, selecting any one test curve F (t) as a reference curveand the other test curve H (t) as a reference curve, and carrying out rotation and translation transformation on the reference curve H (t) to obtain a function family H'(t) = H (t) + at + b with (a, b) as a parameter; step 2, calculating a functional, step 3, calculating a minimum value min [pi(a, b)] of the functional, that is, an optimal coincidence state of the curve; step 4, solving the relevancy of the curves. The invention designs and develops a quantitative calculation method for correlation of two test curves, any one test curve is used as a reference curve to evaluate the correlationof the other reference curve and the reference curve, and the correlation is quantitatively expressed through a correlation index, so that the accuracy of correlation evaluation can be improved. 本发明公开了一种用于两条试验曲线相关性的定量计算方法包括：步骤