Antenna test method and device

The application provides an antenna test method and device. The test device comprises a probe array used for setting an amplitude and a phase to enable emitted signals to be in a preset frequency bandrange and form planar waves in accordance with a test requirement in a specified silent zone, and re...

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Main Authors GUO YUHANG, WEI GUIMING, CHEN KAI, XU FEI, YANG SIYUAN, ZHANG XIANG, REN YUXIN, ZHU YING, PAN CHONG, WU XIANG, GUO FENGRAN, SUN HAO, ZHANG YU, LI LEI
Format Patent
LanguageChinese
English
Published 16.08.2019
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Summary:The application provides an antenna test method and device. The test device comprises a probe array used for setting an amplitude and a phase to enable emitted signals to be in a preset frequency bandrange and form planar waves in accordance with a test requirement in a specified silent zone, and receiving and emitting the signals during the test; and a signal processing unit used for performingpower control, signal synthesis and signal filtering processing on the signals received by the probe array, and outputting a processing result to a test instrument to test a radio frequency index of an antenna. According to the scheme, the test capability of a far field and a compact field can be realized in a short distance with low cost. 本申请提供了一种天线测试方法和设备,该测试设备包括:探头阵列,用于设置幅度和相位使发射的信号在预设频带范围内,以及指定的静区内形成符合测试要求的平面波;并在测试时,接收和发射信号;信号处理单元,用于将所述探头阵列接收的信号进行功率控制、信号合成和信号滤波处理,并将处理结果输出值测试仪表以测试天线的射频指标。该方案能够在较近的距离和较低的成本下,实现远场和紧缩场的测试能力。
Bibliography:Application Number: CN201910366770