Aggregation-induced emission probe and method for dual detection of heavy metal ion pollutants

• Main Authors: TANG BENZHONG, HUANG LETAO, GAO MENG
• Format: Patent
• Language: Chinese; English
• Published: 16.08.2019
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention belongs to the technical field of fluorescence detection and discloses an aggregation-induced emission probe and a method for dual detection of heavy metal ion pollutants. The structuralformula of the aggregation-induced emission probe is I. The method for dual detection of heavy metal ion pollutants comprises the following steps: light-emitting bacteria are cultured in a solution containing the aggregation-induced emission probe and heavy metal ions, the light-emitting bacteria are used for enriching the heavy metal ions in the solution, and the probe is used for detecting theheavy metal ions enriched by the light-emitting bacteria in a fluorescent mode, so that dual detection of the heavy metal ions is realized. The probe in the invention hardly emits fluorescence in an aqueous solution. When being combined with the light-emitting bacteria, the probe is selectively '' lightened '' to detect the heavy metal ions enriched in the light-emitting bacteria, and the probe has the advantage of being h