LOGIC CIRCUIT BLOCK LAYOUTS WITH DUAL-SIDED PROCESSING
An integrated circuit device may include a p-type metal oxide semiconductor (PMOS) transistor supported by a backside of an isolation layer (620). The integrated circuit device may also include an n-type metal oxide semiconductor (NMOS) transistor supported by a front-side of the isolation layer, op...
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Main Authors | , |
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Format | Patent |
Language | Chinese English |
Published |
02.08.2019
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Subjects | |
Online Access | Get full text |
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Summary: | An integrated circuit device may include a p-type metal oxide semiconductor (PMOS) transistor supported by a backside of an isolation layer (620). The integrated circuit device may also include an n-type metal oxide semiconductor (NMOS) transistor supported by a front-side of the isolation layer, opposite the backside. The integrated circuit device may further include a shared contact (640) extending through the isolation layer and electrically coupling a first terminal of the PMOS transistor to the first terminal of the NMOS transistor.
一种集成电路器件可以包括由隔离层(620)的背面支撑的p型金属氧化物半导体(PMOS)晶体管。集成电路器件还可以包括由隔离层的与背面相对的正面支撑的n型金属氧化物半导体(NMOS)晶体管。集成电路器件可以进一步包括共享接触部(640),其延伸穿过隔离层,并且将PMOS晶体管的第一端子电耦合到NMOS晶体管的第一端子。 |
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Bibliography: | Application Number: CN201780078816 |