Sample test method and device for material deformation analysis

• Main Authors: LU LEI, CAI YANG, YE SHIJIA, CHEN KUNYANG, LUO SHENGNIAN
• Format: Patent
• Language: Chinese; English
• Published: 16.07.2019
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

The invention relates to the field of material testing, in particular to a sample test method and device for material deformation analysis. The sample test method for material deformation analysis comprises the following operations of receiving lasers of different frequencies at different positions on the free surface of the sample, and obtaining the free surface information of the sample by an optical fiber Doppler velocity-measuring system; when the sample is subjected to impact loading, obtaining the signal change information on the free surface of the sample; and analyzing the signal change information. Thus, the effective combination of the optical hybrid fiber can better obtain the deformation evolution of the non-uniform material at a high strain rate. The sample test device comprises a light gas gun, a sample stage, a velocity measuring device, a light sensor, a first laser and a second laser, wherein the light sensor is electrically connected with a second oscilloscope, and the second oscilloscope is