A measuring instrument management and control system and method

• Main Authors: LIN HU, WANG ZHIYI, XIE YINGPENG, LI QUNXIAN, JIANG SHUO, CHEN QINGTAI, YAN HUAJIANG, HAN XIAOHAN, HU MEIYI, ZHOU AIQUN, DAI XIANGWEN, SHU CHENGYE, LOU HUAN, XU JINLIANG, JIANG YONG, ZHENG BEI
• Format: Patent
• Language: Chinese; English
• Published: 21.06.2019
• Subjects: CALCULATING; COMPUTING; COUNTING; HANDLING RECORD CARRIERS; PHYSICS; PRESENTATION OF DATA; RECOGNITION OF DATA; RECORD CARRIERS

The invention relates to a metering device management and control system and method. The system comprises an electronic tag, a reading terminal, a server and an encryption unit, the electronic tag isarranged on a measuring instrument, the reading terminal is connected with the server through a network, the encryption unit is connected with the server, the electronic tag is a torn-off self-destruction tag, and the reading terminal is provided with a card reading adjusting mechanism. The management and control method based on the system comprises a measuring instrument inspection method and a measuring instrument management method. The method has the advantages that by tearing off the self-destruction label, the unique corresponding relation between the measuring instrument and the electronic label can be ensured, and the situation that the information carried by the label is inconsistent with the actual situation of the recorder is avoided; and the radio frequency signal limiting frameis arranged, so that the