Testing system and method of JESD204B protocol high-speed sender single-particle error rate

• Main Authors: ZHENG HONGCHAO, BIAN QIANG, WU YONGJUN, XU LEIPEI, ZHAO XU, CHEN MAOXIN, SONG XIAOJING, LI ZHE, YU CHUNQING, DONG FANGLEI, MU LILONG, BI XIAO, PENG HUIXIN, DU SHOUGANG, ZHANG XUSHEN
• Format: Patent
• Language: Chinese; English
• Published: 16.04.2019
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC COMMUNICATION TECHNIQUE; ELECTRIC DIGITAL DATA PROCESSING; ELECTRICITY; PHYSICS; TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION

The invention discloses a testing system and method of a JESD204B protocol high-speed sender single-particle error rate. The testing system is built by a high-speed sender and a programmable logic device. The programmable logic device generates parallel data to a parallel end of the high-speed sender, the high-speed sender is configured at the same time, serial data generated by the high-speed sender are sent to the programmable logic device, serial-to-parallel conversion is carried out, and then the programmable logic device parses low-speed data, and detects the single-particle error rate ofthe high-speed sender. According to the system, a single-particle machine time utilization rate is effectively improved, a data link is complete, the programmable logic device is utilized for deserializing on the high-speed serial data to form the low-speed parallel data for processing rather than using expensive instruments such as error code instruments and high-speed oscilloscopes for monitoring, high-speed signal tes