Gamma photon effect location sampling method and device, electronic equipment and storage medium

• Main Authors: LIU MAI, JIANG NIANMING, LYU ZHENLEI, WEI QINGYANG, LIU YAQIANG, XU TIANPENG
• Format: Patent
• Language: Chinese; English
• Published: 12.04.2019
• Subjects: MEASUREMENT OF NUCLEAR OR X-RADIATION; MEASURING; PHYSICS; TESTING

The application provides a Gamma photon effect location sampling method and device, electronic equipment and a storage medium. The method comprises the following steps: determining a crystal identifier that gamma photon takes effect according to an output signal of a flash crystal detector, and acquiring probability distribution of a crystal internal effect location corresponding to the crystal identifier, and sampling the location that the gamma photon takes effect in the target crystal according to the probability distribution of the crystal internal effect location, thereby obtaining a target effect location that the gamma photo takes effect in the target crystal. Therefore, the location that the gamma photon takes effect in the target crystal is accurately sampled based on the probability distribution of the internal effect location of the crystal, the target effect location of taking effect in the crystal is accurately obtained, thereby laying the foundation for subsequently and accurately reconstructing