Single particle effect test method, device and system and electronic device of visual information processing circuit

• Main Authors: ZHENG HONGCHAO, LI JIANCHENG, WANG FUQING, XU LEIPEI, ZHAO XU, LI ZHE, YU CHUNQING, CHU FEI, DONG FANGLEI, YUE SUGE, MU LILONG, TAO HUIBIN, BI XIAO, PENG HUIXIN, DU SHOUGANG
• Format: Patent
• Language: Chinese; English
• Published: 05.04.2019
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses a single particle effect test method, device and system and an electronic device of a visual information processing circuit, belonging to the technical field of device testing.The method comprises steps of in irradiation, controlling all functional modules of the visual information processing circuit to run in sequence, before controlling a next functional module to run, determining whether the function of the current functional module is normal; if yes, storing an actual processing result of the current functional module in a storage module, and controlling the next functional module to run; if not, recording a primary function error, and returning to the initial step and re-running the functional modules; after all functional modules complete running, comparing an actual processing result with a standard processing result of each functional module, and determining a number of single particle overturn errors of each functional module; and according to the number of function errors and