Transient temperature field test method and system based on high-speed imaging technology
The invention discloses a transient temperature field test method and system based on a high-speed imaging technology. The transient temperature field test system comprises a color high-speed camera,a medium-density optical filter, an optical lens and a computer. The transient temperature field test...
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Main Authors | , |
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Format | Patent |
Language | Chinese English |
Published |
22.03.2019
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Subjects | |
Online Access | Get full text |
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Summary: | The invention discloses a transient temperature field test method and system based on a high-speed imaging technology. The transient temperature field test system comprises a color high-speed camera,a medium-density optical filter, an optical lens and a computer. The transient temperature field test method comprises the steps that the optical lens focuses lightness information generated by a transient temperature field on a CMOS image sensor of the high-speed camera; the medium-density optical filter is used for controlling the light amount so that it can be guaranteed that the camera works in an unsaturated area and the upper temperature measurement limit can be expanded at the same time; the high-speed camera converts the light information which is imaged on the CMOS sensor into digitalimage RGB information; the computer analyzes the transient temperature field image information collected by the high-speed camera, and according to a temperature conversion model which is obtained through calibration of the c |
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Bibliography: | Application Number: CN201811463395 |