Measuring device for diode characteristics of crystal oscillator

• Main Authors: ZHENG BAOQI, GAO ZHIXIANG
• Format: Patent
• Language: Chinese; English
• Published: 19.03.2019
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention provides a measuring device for the diode characteristics of a crystal oscillator. The device structurally includes a test base, a base and two sets of control switches. The test base islocated at the center of the upper surface of the base, and the control switches are installed on the left and right sides of the test base on the upper surface of the base side by side. The device has the advantages that the operation is simple, crystal oscillators of various sizes can be conveniently measured, the measurement error is small and the result is reliable. 本发明提出的是种晶体振荡器二极管特性的测量装置，其结构包括测试座、底座和控制开关，其中测试座设于底座上表面的中心，控制开关包括2组，分别并排安装于底座上表面测试座的左、右两侧。本发明的优点：操作简单，可方便地测量各种尺寸晶振，测量误差小，结果可靠。