Defect inspection device, defect inspection method, method for manufacturing circular polarizing plate or elliptical polarizing plate, and method for manufacturing phase difference plate

• Main Author: NIWA TAIKI
• Format: Patent
• Language: Chinese; English
• Published: 19.03.2019
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention provides a defect inspection device and defect inspection method with high universality and used for inspecting the defect of a circular polarizing plate or elliptical polarizing plate or the defect of a phase difference plate used for the generation of circularly polarized light or elliptically polarized light, a method for manufacturing the circular polarizing plate or elliptical polarizing plate using the defect inspection method, and a mehtod for manufacturing the phase difference plate. The defect inspection device comprises a light irradiating portion that is disposed on alinearly polarizing plate side of the circular polarizing plate or elliptical polarizing plate and that irradiates inspection light to an imaging region of the circular polarizing plate or ellipticalpolarizing plate; and a reflection member that is disposed on the opposite side of the light irradiating portion when viewed from the circular polarizing plate or elliptical polarizing plate, and thatreflects the light output