A method and apparatus for judging data abnormality

The embodiment of the invention discloses a method and a device for judging data abnormality, Through the analysis of the relationship between two sets of data, When one cost data is larger than the other and the sub-data constituting the cost data is smaller than the sub-data of the other cost data...

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Bibliographic Details
Main Authors CHEN MING, MA DAKUI, JIANG YULIANG, HU JINLAN, LIU GANGGANG, QIN WANXIANG, GAO XIAOBIN, ZHOU YAN, SUN GANG, QIN YAN, HOU KAI, MA SHUN, HAN CHUN
Format Patent
LanguageChinese
English
Published 15.03.2019
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:The embodiment of the invention discloses a method and a device for judging data abnormality, Through the analysis of the relationship between two sets of data, When one cost data is larger than the other and the sub-data constituting the cost data is smaller than the sub-data of the other cost data, it can be judged that the abnormal situation is not caused by the calculation anomaly of the dataitself. 本发明实施例公开了种数据异常的判断方法及装置，其中方法通过对两组数据数值的关系分析，进行判断数据异常的情况，来实现数据的诊断，可以在当个造价数据大于另个数据，且出现组成造价数据的子数据却小于另个造价数据的子数据时，判断出异常的情况不是由于数据本身的计算异常导致的。
Bibliography:Application Number: CN201811297075