Vertical-type memory device and manufacturing method thereof

The present invention provides a vertical-type memory device and a manufacturing method thereof, the device including a substrate having a cell array region and a connection region; gate electrode layers stacked on the cell array region and the connection region of the substrate, the gate electrode...

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Bibliographic Details
Main Authors HYUN GOO JUN, JONG WON KIM
Format Patent
LanguageChinese
English
Published 05.02.2019
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Summary:The present invention provides a vertical-type memory device and a manufacturing method thereof, the device including a substrate having a cell array region and a connection region; gate electrode layers stacked on the cell array region and the connection region of the substrate, the gate electrode layers forming a stepped structure in the connection region; a cell channel layer in the cell arrayregion, the cell channel layer passing through the plurality of gate electrode layers; a dummy channel layer in the connection region, the dummy channel layer passing through at least one gate electrode layer of the plurality of gate electrode layers; a cell epitaxial layer disposed below the cell channel layer; and a dummy epitaxial layer disposed below the dummy channel layer, wherein the dummyepitaxial layer has a shape that is different from a shape of the cell epitaxial layer. 提供了种垂直型存储器装置及其制造方法,所述装置包括:衬底,具有单元阵列区域和连接区域;栅电极层,堆叠在衬底的单元阵列区域和连接区域上,栅电极层在连接区域中形成阶梯结构;单元通道层,在单元阵列区域中,单元通道层穿过所述多个栅电极层;虚设通道层,在连接区域中,虚设通道层穿过所述多
Bibliography:Application Number: CN201810785583