Test method for short-cycle mass-produced satellites
The invention discloses a test method for short-cycle mass-produced satellites and relates to the test method for the mass-produced satellites. The test method is a main test content at a desktop integration test stage in a mass-produced satellite comprehensive test project and includes a satellite...
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Main Authors | , , , , , , , , |
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Format | Patent |
Language | Chinese English |
Published |
25.01.2019
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Subjects | |
Online Access | Get full text |
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Summary: | The invention discloses a test method for short-cycle mass-produced satellites and relates to the test method for the mass-produced satellites. The test method is a main test content at a desktop integration test stage in a mass-produced satellite comprehensive test project and includes a satellite interface test method and a satellite function performance test method, wherein the satellite interface test method comprises a traversal test of the satellite interface test content on each star of the mass-produced satellites in the same batch; the satellite function performance test method comprises (1) a hardware-related function and performance test, and (2) a software-related function test; in the hardware-related function and performance test, the traversal test on each star of the mass-produced satellites in the same batch is adopted; in the software-related function test, satellite-borne software is checked, the software-related function test is divided into multiple test projects,part of the test projects |
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Bibliography: | Application Number: CN201810946125 |