Test method for short-cycle mass-produced satellites

The invention discloses a test method for short-cycle mass-produced satellites and relates to the test method for the mass-produced satellites. The test method is a main test content at a desktop integration test stage in a mass-produced satellite comprehensive test project and includes a satellite...

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Bibliographic Details
Main Authors ZHANG RUI, LIANG XUWEN, LIU KUO, YAN MEI, LI JING, CAO CAIXIA, FENG ZHENGGONG, WANG HAO, CHEN BO
Format Patent
LanguageChinese
English
Published 25.01.2019
Subjects
AIRCRAFT
AVIATION
COSMONAUTICS
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PERFORMING OPERATIONS
PHYSICS
TESTING
TRANSMISSION
TRANSPORTING
VEHICLES OR EQUIPMENT THEREFOR
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Summary:The invention discloses a test method for short-cycle mass-produced satellites and relates to the test method for the mass-produced satellites. The test method is a main test content at a desktop integration test stage in a mass-produced satellite comprehensive test project and includes a satellite interface test method and a satellite function performance test method, wherein the satellite interface test method comprises a traversal test of the satellite interface test content on each star of the mass-produced satellites in the same batch; the satellite function performance test method comprises (1) a hardware-related function and performance test, and (2) a software-related function test; in the hardware-related function and performance test, the traversal test on each star of the mass-produced satellites in the same batch is adopted; in the software-related function test, satellite-borne software is checked, the software-related function test is divided into multiple test projects,part of the test projects
Bibliography:Application Number: CN201810946125