System for measuring atmospheric refraction of underlying surface by utilizing aircraft, and test method

• Main Authors: JING XU, ZHANG SILONG, QIN LAI'AN, TAN FENGFU, WU YI, WANG YINGJIAN, ZHANG SHOUCHUAN, HE FENG, HOU ZAIHONG
• Format: Patent
• Language: Chinese; English
• Published: 18.01.2019
• Subjects: AEROPLANES; AIRCRAFT; AVIATION; COSMONAUTICS; HELICOPTERS; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PERFORMING OPERATIONS; PHYSICS; TESTING; TRANSPORTING

The invention discloses a system for measuring the atmospheric refraction of an underlying surface by utilizing an aircraft, and a test method. The system comprises the aircraft; a visual axis stabilizer is arranged on the aircraft; a base is arranged on the visual axis stabilizer; multiple light so...