System for measuring atmospheric refraction of underlying surface by utilizing aircraft, and test method

• Main Authors: JING XU, ZHANG SILONG, QIN LAI'AN, TAN FENGFU, WU YI, WANG YINGJIAN, ZHANG SHOUCHUAN, HE FENG, HOU ZAIHONG
• Format: Patent
• Language: Chinese; English
• Published: 18.01.2019
• Subjects: AEROPLANES; AIRCRAFT; AVIATION; COSMONAUTICS; HELICOPTERS; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PERFORMING OPERATIONS; PHYSICS; TESTING; TRANSPORTING

The invention discloses a system for measuring the atmospheric refraction of an underlying surface by utilizing an aircraft, and a test method. The system comprises the aircraft; a visual axis stabilizer is arranged on the aircraft; a base is arranged on the visual axis stabilizer; multiple light sources are installed on the base; the multiple light sources include at least two first-wavelength light sources and at least one second-wavelength light source; and all the centres of the multiple light sources are on the same straight line. According to the system for measuring the atmospheric refraction of the underlying surface by utilizing the aircraft, and the test method in the invention, the aircraft carrying the light sources different in wavelength flies to a point needing to be observed; the atmospheric refraction/refraction chromatic aberration of other appointed wavelengths is calculated through the refraction chromatic aberration of the first wavelength and the second wavelength; the temperature, the h