CRYSTAL PHASE QUANTITATIVE ANALYSIS DEVICE, CRYSTAL PHASE QUANTITATIVE ANALYSIS METHOD, AND CRYSTAL PHASE QUANTITATIVE ANALYSIS PROGRAM

• Main Authors: TORAYA HIDEO, HIMEDA AKIHIRO
• Format: Patent
• Language: Chinese; English
• Published: 21.12.2018
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

Provided are an X-ray analysis operation guide system, operation guide method and operation guide program with which it is easy for a user to understand a measurement of an X-ray optical system to beselected. This crystal phase quantitative analysis device is provided with: a qualitative analysis result acquiring means for acquiring information relating to a plurality of crystal phases containedin a specimen; and a weight ratio calculating means for calculating the weight ratios of the plurality of crystal phases on the basis of the sum of diffraction intensities subjected to correction withrespect to the Lorentz-polarization factor, for the plurality of crystal phases, the chemical formula weights for the plurality of crystal phases, and the sum of the squares of the number of electrons belonging to each atom contained in each chemical formula unit, for the plurality of crystal phases. 本发明提供种能够让用户容易地理解所选择的X射线光学系的测量的X射线分析的操作导向系统、操作导向方法、以及操作导向程序。具备：定性分析结果取得单元，其取得试样中所含有的多个结晶相的信息；重量比计算单元，其基于多个结晶相中的、进行了对洛伦兹偏振因子的补