Integrated circuit testing excitation generation method based on modular excitation model

• Main Authors: ZHENG JINYAN, LI SI, ZHANG CONG, LIU JUN, GAO XIAOQIONG, LI NA, WEI WEIBO, LI ANG, AN PENGWEI, HONG NAN, ZHANG QING, CHEN PENG, ZHAO CHANG, ZHANG YIYI, JI WEIWEI
• Format: Patent
• Language: Chinese; English
• Published: 21.12.2018
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention belongs to the technical field of integrated circuit testing, and particularly relates to an integrated circuit testing excitation generation method based on a modular excitation model.According to the integrated circuit testing excitation generation method based on the modular excitat...