Integrated circuit testing excitation generation method based on modular excitation model

• Main Authors: ZHENG JINYAN, LI SI, ZHANG CONG, LIU JUN, GAO XIAOQIONG, LI NA, WEI WEIBO, LI ANG, AN PENGWEI, HONG NAN, ZHANG QING, CHEN PENG, ZHAO CHANG, ZHANG YIYI, JI WEIWEI
• Format: Patent
• Language: Chinese; English
• Published: 21.12.2018
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention belongs to the technical field of integrated circuit testing, and particularly relates to an integrated circuit testing excitation generation method based on a modular excitation model.According to the integrated circuit testing excitation generation method based on the modular excitation model, a time axis configuration method is applied to generate task points corresponding to testing cases, and an excitation file containing the excitation model is formed by configuring the task points, the generation of an excitation signal is realized. The task points are enabled to correspond to the testing cases, and visual management and batch execution of the test cases are realized. The integrated circuit testing excitation generation method based on the modular excitation model notonly solves the contradictions of high labor cost and complicated debugging in an existing scheme, but also has a simple configuration method, and is suitable for simulation testing of integrated circuits such as ASIC, SOC an