Sample test carrier for secondary electron emission coefficient measurement of dielectric material

• Main Authors: HE JIALONG, WANG TAO, PENG YUFEI, ZHENG LE, LI JIE, LIU PING, LONG JIDONG, LAN ZHAOHUI, LIU ERXIANG, SHI JINSHUI, DONG PAN, ZHAO WEI, LI XI, YANG JIE, YANG ZHEN
• Format: Patent
• Language: Chinese; English
• Published: 27.11.2018
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a sample test carrier for secondary electron emission coefficient measurement of a dielectric material. The carrier comprises a carrier body, the carrier body comprises a sample mounting section, an insulating section and a connecting section, the sample mounting section and the connecting section are connected in series through the insulating section, and the insulating section serves as an insulating part between the sample mounting section and the connecting section. The carrier further comprises a Faraday cylinder arranged on the sample mounting section. The sampletest carrier can conveniently and accurately measure an incident pulse electronic signal, interference borne by the measured signal is reduced, and therefore the measurement accuracy of a secondary electron emission coefficient of the dielectric material is improved. 本发明公开了种用于介质材料二次电子发射系数测量的样品测试载台，包括载台本体，所述载台本体包括样品安装段、绝缘段及连接段，所述样品安装段与连接段通过绝缘段串联，且所述绝缘段作为样品安装段与连接段之间的绝缘部件；还包括设置在样品安装段上的法拉第筒。该样品测试载台可以方便准确地测定入射脉冲电子信号，降低被测信号受到的干