Detection clamp of multi-diameter perforated blade suitable for scanning electron microscope

• Main Authors: SHI RUXIN, ZHANG HUIPING, WANG ZUNJING
• Format: Patent
• Language: Chinese; English
• Published: 26.10.2018
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS; ELECTRICITY; HAND TOOLS; MANIPULATORS; PERFORMING OPERATIONS; PORTABLE POWER-DRIVEN TOOLS; TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FORFASTENING, CONNECTING, DISENGAGING OR HOLDING; TRANSPORTING

The invention discloses a detection clamp of a multi-diameter perforated blade suitable for a scanning electron microscope. The detection clamp comprises a clamp fixing part, a tapered blade fixing part and a spring clamping part and is mainly characterized in that the multi-diameter blade is detected, and the tapered blade fixing part can rotate by 360 degrees on the clamp fixing part. During placing of the blade to be detected, the only requirement is to pull open the spring clamping part, then, the blade is placed between the spring clamping part and the tapered blade fixing part, meanwhile, the spring clamping part is released to clamp the blade to be detected, and further, the blade is detected. Compared with a traditional clamp for the scanning electron microscope, different positions of front tool faces and rear tool faces of the multi-diameter blade can be detected; the step of painting the blade to be detected with a binder can be fully reduced, so that pollution to the surface of the blade to be det